Tc max
80.0 K
Tc ambient
—
arXiv year
2002
Papers
1
Tc exp.
80.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.66.094505
Overlayer
ba0.9nd0.1cuo2x
Substrate
cacuo2
Evidence (3 records from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 80.0 | — | thin_film | resistivity | — | 2002 | T1 | DOI: 10.1103/PhysRevB.66.094505 |
| 35.0 | — | thin_film | susceptibility | — | 2002 | T1 | DOI: 10.1103/PhysRevB.66.094505 |
| 30.0 |
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SrTiO3