Tc max
6.0 K
Tc ambient
6.0 K
arXiv year
2014
Papers
9
Tc exp.
6.0 K
Tc theo.
5.3 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:2506.20861, confirmed by 2 papers
Evidence (16 records from 9 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.2 | 0.9 | single_crystal | susceptibility | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.220506 |
| 6.0 | — | thin_film | resistivity | — | 2025 | — | 2506.20861 |
| 6.0 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/xfr5-8qcy |
| 6.0 | ambient | single_crystal | resistivity, susceptibility | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.214509 |
| 6.0 | ambient | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.220506 |
| 6.0 | ambient | single_crystal | resistivity | — | 2018 | — | 1808.10043 |
| 6.0 | ambient | single_crystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.220506 |
| 5.8 | — | single_crystal | specific_heat | s-wave | 2014 | — | 1406.2956 |
| 5.8 | — | single_crystal | susceptibility, resistivity | s-wave | 2014 | — | 1406.2956 |
| 5.8 | — | thin_film | resistivity | — | 2025 | — | 2506.20861 |
| 5.8 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/xfr5-8qcy |
| 5.8 | — | thin_film | resistivity | — | 2025 | — | 2506.20861 |
| 5.3 | — | — | — | — | 2015 | T2 | 1510.05719 |
| 5.1 | 0.8 | single_crystal | susceptibility | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.220506 |
| — | — | thin_film | STM | — | 2018 | — | 1808.07372 |
| — | — | thin_film | STM | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.064511 |
Structure
- Crystal structure
- tetragonal
- Space group
- P4/mmm (#123)
- Phase
- infinite_layer
- Lattice a (Å)
- 5.060
- Lattice c (Å)
- 5.130
Superconducting parameters
- Hc2
- 2.8 T (0 K)
- λ_eph (e–ph coupling)
- 1.43
- ω_log
- 49 K
Competing orders
- ρ(T) exponent
- 2.00
Samples & pressure
- Substrate
- SrTiO3
- Pressure type
- none