Tc max
25.0 K
Tc ambient
20.0 K
arXiv year
2010
Papers
2
Tc exp.
25.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.81.104525
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 25.0 | — | polycrystal | resistivity, susceptibility | — | 2010 | T1 | DOI: 10.1103/PhysRevB.81.104525 |
| 20.0 | ambient | single_crystal | resistivity | — | 2012 | — | 1203.5114 |
Structure
- Crystal structure
- ThCr2Si2
- Space group
- I4/mmm
- Phase
- 122
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Competing orders
- Competing order
- AFM
Samples & pressure
- Doping type
- electron