Tc max
22.0 K
Tc ambient
22.0 K
arXiv year
2009
Papers
3
Tc exp.
22.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.81.174512, confirmed by 2 papers
Evidence (4 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 22.0 | — | polycrystal | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.81.174512 |
| 22.0 | — | polycrystal | — | — | 2009 | T1 | 0902.2728 |
| 20.0 | — |
Structure
- Crystal structure
- ThCr2Si2
- Space group
- I4/mmm
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Competing orders
- Competing order
- SDW
- T_SDW
- 127.0 K
Samples & pressure
- Sample form
- polycrystal
- Doping type
- isovalent