Tc max
8.0 K
Tc ambient
1.0 K
arXiv year
1991
Papers
2
Tc exp.
8.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1703.10814
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 8.0 | — | thin_film | resistivity | — | 2017 | T1 | 1703.10814 |
| 1.0 | ambient | single_crystal | resistivity, STM | — | 1991 | T1 | DOI: 10.1103/PhysRevLett.67.509 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SrTiO3