Tc max
4.0 K
Tc ambient
2.0 K
arXiv year
2000
Papers
12
Tc exp.
4.0 K
Tc theo.
9.1 K
Evidence
mixed
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.88.206802, confirmed by 2 papers
Evidence (21 records from 12 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 9.1 | — | thin_film | — | — | 2026 | T1 | DOI: 10.1103/xb8k-9539 |
| 8.5 | — | — | — | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.094501 |
| 8.5 | — | — | — | — | 2024 | T2 | 2407.18254 |
| 6.4 | — | — | — | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.094501 |
| 6.2 | — | — | — | — | 2024 | T2 | 2407.18254 |
| 6.1 | — | — | — | — | 2024 | T2 | 2407.18254 |
| 6.0 | — | thin_film | resistivity | — | 2000 | T2 | cond-mat/0009264 |
| 4.3 | — | — | — | — | 2024 | T2 | 2407.18254 |
| 4.0 | — | thin_film | resistivity | — | 2002 | T1 | DOI: 10.1103/PhysRevLett.88.206802 |
| 3.8 | — | — | — | — | 2024 | T2 | 2407.18254 |
| 3.5 | — | thin_film | resistivity | — | 2009 | T1 | 0901.1873 |
| 2.8 | — | — | — | — | 2024 | T2 | 2407.18254 |
| 2.2 | — | — | — | — | 2024 | T2 | 2407.18254 |
| 2.0 | — | thin_film | resistivity | — | 2002 | T1 | DOI: 10.1103/PhysRevLett.88.206802 |
| 2.0 | ambient | thin_film | resistivity | — | 2001 | T1 | cond-mat/0108232 |
| 0.7 | — | thin_film | resistivity | s-wave | 2006 | T1 | DOI: 10.1103/PhysRevLett.96.127002 |
| 0.7 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0509385 |
| 0.5 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevLett.92.067003 |
| 0.5 | — | thin_film | resistivity | — | 2002 | T1 | DOI: 10.1103/PhysRevLett.88.206802 |
| 0.1 | ambient | — | — | — | 2026 | T3 | 2602.07585 |
| — | ambient | — | — | — | 2026 | T2 | 2601.13292 |
Superconducting parameters
- λ_eph (e–ph coupling)
- 0.53
Samples & pressure
- Sample form
- thin_film
- Substrate
- fire polished glass