Tc max
14.0 K
Tc ambient
4.4 K
arXiv year
1986
Papers
81
Tc exp.
14.0 K
Tc theo.
6.8 K
Evidence
experimental
Tc max measured at thin_film, STM, arXiv:2503.07229, confirmed by 2 papers
Evidence (127 records from 81 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 16.0 | — | polycrystal | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.014532 |
| 14.0 | — | thin_film | STM | — | 2025 | — | 2503.07229 |
| 10.4 | — | polycrystal | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.014532 |
| 8.8 | — | powder | resistivity, susceptibility | — | 2011 | T1 | 1109.3134 |
| 8.4 | — | polycrystal | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.014532 |
| 8.4 | — | polycrystal | susceptibility | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.132507 |
| 8.4 | — | polycrystal | susceptibility | — | 2005 | T3 | cond-mat/0506107 |
| 8.2 | 8.1 | single_crystal | susceptibility | — | 2017 | T1 | DOI: 10.1103/PhysRevB.95.024510 |
| 8.2 | 8.1 | single_crystal | resistivity | — | 2016 | T1 | 1610.06062 |
| 8.0 | 8.1 | single_crystal | susceptibility | — | 2016 | T1 | 1610.06062 |
| 7.3 | — | polycrystal | resistivity, susceptibility | — | 2011 | T1 | 1109.3134 |
| 7.0 | 2.7 | polycrystal | muSR, susceptibility | s-wave | 2018 | T1 | DOI: 10.1103/PhysRevB.98.140504 |
| 7.0 | 2.7 | — | — | s-wave | 2018 | T1 | DOI: 10.1103/PhysRevB.98.140504 |
| 7.0 | 2.8 | single_crystal | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.95.024510 |
| 7.0 | 2.8 | single_crystal | resistivity | — | 2016 | T1 | 1610.06062 |
| 7.0 | 2.5 | single_crystal | susceptibility | — | 2016 | T1 | 1610.06062 |
| 7.0 | 3.2 | single_crystal | susceptibility | — | 2016 | T1 | 1610.06062 |
| 6.8 | — | — | — | — | 2018 | T1 | 1808.04250 |
| 6.5 | — | — | — | — | 2018 | T1 | 1808.04250 |
| 6.4 | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3567 |
| 5.9 | — | polycrystal | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevB.34.1956 |
| 5.8 | — | thin_film | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.7005 |
| 5.5 | — | — | — | — | 1997 | T2 | cond-mat/9710189 |
| 5.0 | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.092509 |
| 4.4 | — | thin_film | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.104502 |
| 4.4 | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0011197 |
| 4.3 | — | thin_film | STM | — | 2023 | T1 | 2304.02243 |
| 4.3 | — | polycrystal | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.014532 |
| 4.3 | — | polycrystal | susceptibility | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.132507 |
| 4.3 | — | thin_film | resistivity | — | 1998 | T1 | DOI: 10.1103/PhysRevB.58.12422 |
| 4.3 | — | — | — | — | 2018 | T1 | 1808.04250 |
| 4.3 | — | — | — | — | 2017 | T2 | 1710.08939 |
| 4.2 | — | thin_film | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.104502 |
| 4.2 | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0011197 |
| 4.1 | — | — | resistivity, susceptibility | — | 2011 | T1 | 1108.5762 |
| 4.0 | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.68.2224 |
| 4.0 | — | thin_film | resistivity, STM | — | 1990 | T1 | DOI: 10.1103/PhysRevB.42.179 |
| 4.0 | 2.8 | — | — | — | 2019 | T1 | 1902.09409 |
| 4.0 | 2.8 | — | — | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.174506 |
| 3.9 | 2.8 | — | muSR | — | 2019 | T1 | 1902.09409 |
| 3.9 | 2.8 | — | susceptibility | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.174506 |
| 3.9 | 2.6 | single_crystal | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.95.024510 |
| 3.9 | 2.6 | single_crystal | resistivity | — | 2016 | T1 | 1610.06062 |
| 3.9 | 2.8 | single_crystal | resistivity | — | 2016 | T1 | 1610.06062 |
| 3.9 | 2.5 | single_crystal | susceptibility | — | 2016 | T1 | 1610.06062 |
| 3.9 | — | thin_film | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.7005 |
| 3.9 | — | polycrystal | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevB.34.1956 |
| 3.8 | — | thin_film | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.104502 |
| 3.8 | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0011197 |
| 3.7 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0506030 |
| 3.6 | — | — | — | — | 2018 | T1 | 1808.04250 |
| 3.5 | — | thin_film | resistivity | — | 2002 | T1 | cond-mat/0209023 |
| 3.0 | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.84.224521 |
| 3.0 | — | — | resistivity | — | 2011 | T1 | 1111.3445 |
| 3.0 | — | thin_film | resistivity | — | 2001 | T3 | cond-mat/0110415 |
| 2.6 | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.092509 |
| 2.6 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0506030 |
| 2.6 | — | — | — | — | 2017 | — | 1712.05461 |
| 2.5 | — | thin_film | susceptibility | — | 2003 | T2 | cond-mat/0308312 |
| 2.5 | — | polycrystal | susceptibility | — | 2002 | T1 | DOI: 10.1103/PhysRevB.66.014533 |
| 2.2 | — | thin_film | resistivity | — | 2011 | — | 1101.5642 |
| 2.0 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevLett.66.385 |
| 1.5 | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.140501 |
| 1.5 | — | thin_film | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.100508 |
| 1.4 | — | thin_film | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.R9245 |
| 1.3 | — | thin_film | resistivity | — | 2011 | — | 1101.5642 |
| 1.3 | — | wire | resistivity | — | 2009 | T1 | 0903.2855 |
| 0.8 | — | thin_film | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.R9245 |
| 0.7 | — | — | resistivity, susceptibility | — | 2011 | T1 | 1108.5762 |
| 0.7 | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3567 |
| 0.6 | — | thin_film | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.103.157001 |
| 0.5 | — | thin_film | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevLett.94.197004 |
| 0.5 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0501666 |
| 0.4 | — | thin_film | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevLett.94.197004 |
| 0.4 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0501666 |
| 0.4 | — | thin_film | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevLett.94.197004 |
| 0.4 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0501666 |
| 0.4 | — | thin_film | resistivity | — | 2011 | — | 1101.5642 |
| 0.3 | — | thin_film | resistivity | — | 2017 | T1 | 1710.08212 |
| 0.3 | — | thin_film | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.R9245 |
| 0.3 | — | thin_film | resistivity | — | 2004 | T1 | cond-mat/0406250 |
| 0.3 | — | thin_film | resistivity | — | 2001 | T1 | cond-mat/0108504 |
| 0.3 | — | thin_film | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.R9245 |
| 0.2 | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.3567 |
| 0.1 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0512704 |
| 0.1 | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.74.134517 |
| 0.1 | — | thin_film | resistivity | — | 2006 | T1 | cond-mat/0608494 |
| 0.1 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0512704 |
| 0.1 | — | thin_film | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevLett.94.197004 |
| 0.1 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0501666 |
| 0.1 | — | thin_film | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevLett.94.197004 |
| 0.1 | — | thin_film | resistivity | — | 2005 | T1 | cond-mat/0501666 |
| — | — | thin_film | STM | s-wave | 2025 | T1 | 2508.15184 |
| — | — | — | STM | — | 2025 | — | 2502.07533 |
| — | — | thin_film | STM | — | 2024 | T1 | 2404.12708 |
| — | — | polycrystal | — | — | 2022 | T2 | 2201.00088 |
| — | — | — | STM | — | 2021 | T3 | 2103.14656 |
| — | — | thin_film | resistivity | s-wave | 2019 | T1 | DOI: 10.1103/PhysRevLett.122.157002 |
| — | — | thin_film | STM | — | 2019 | T1 | 1905.05735 |
| — | — | — | — | — | 2018 | T1 | 1808.04250 |
| — | — | thin_film | resistivity | — | 2015 | T1 | 1511.08135 |
| — | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.92.140501 |
| — | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.87.054512 |
| — | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.111.057005 |
| — | — | thin_film | resistivity | — | 2013 | T1 | 1301.6155 |
| — | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevLett.109.017002 |
| — | — | thin_film | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.214511 |
| — | — | thin_film | resistivity | — | 2010 | T1 | 1002.1720 |
| — | — | thin_film | resistivity | — | 2006 | T1 | DOI: 10.1103/PhysRevB.73.174527 |
| — | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.212510 |
| — | — | thin_film | resistivity | — | 2002 | T1 | cond-mat/0209026 |
| — | — | thin_film | resistivity | — | 2002 | T1 | cond-mat/0209027 |
| — | ambient | thin_film | resistivity | — | 2001 | T3 | cond-mat/0108316 |
| — | — | thin_film | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.65.012501 |
| — | — | thin_film | resistivity | — | 2001 | T1 | cond-mat/0103258 |
| — | — | thin_film | resistivity | — | 2001 | T2 | cond-mat/0104003 |
| — | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0007222 |
| — | — | thin_film | resistivity | — | 1999 | T1 | DOI: 10.1103/PhysRevB.60.4320 |
| — | — | thin_film | resistivity | — | 1999 | T1 | cond-mat/9909370 |
| — | — | thin_film | resistivity | — | 1998 | T3 | cond-mat/9808176 |
| — | — | thin_film | resistivity | — | 1998 | T1 | DOI: 10.1103/PhysRevLett.81.5217 |
| — | — | thin_film | resistivity | — | 1998 | T1 | DOI: 10.1103/PhysRevLett.81.701 |
| — | — | thin_film | resistivity | — | 1998 | T2 | cond-mat/9808132 |
| — | — | thin_film | resistivity | — | 1997 | T1 | DOI: 10.1103/PhysRevLett.78.1130 |
| — | — | thin_film | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevB.47.5931 |
| — | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevLett.67.2068 |
| — | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevLett.62.2180 |
Structure
- Crystal structure
- fcc
- Space group
- R-3m (#166)
- Lattice a (Å)
- 5.710
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 4.6 T (0 K)
- λ_eph (e–ph coupling)
- 2.46
- ω_log
- 70 K
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Pressure type
- hydrostatic