Tc max
14.0 K
Tc ambient
4.4 K
arXiv year
1986
Papers
81
Tc exp.
14.0 K
Tc theo.
6.8 K
Evidence
experimental
Tc max measured at thin_film, STM, arXiv:2503.07229, confirmed by 2 papers
Evidence (127 records from 81 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 16.0 | — | polycrystal | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.76.014532 |
| 14.0 | — | thin_film | STM | — | 2025 | — | 2503.07229 |
| 10.4 | — | polycrystal | resistivity |
Structure
- Crystal structure
- fcc
- Space group
- R-3m (#166)
- Lattice a (Å)
- 4.546
- Lattice c (Å)
- 11.860
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 4.6 T (0 K)
- λ_eph (e–ph coupling)
- 2.46
- ω_log
- 70 K
Samples & pressure
- Sample form
- thin_film
- Substrate
- FeTe0.55Se0.45
- Pressure type
- hydrostatic