Tc max
6.1 K
Tc ambient
6.1 K
Discovery
1998
Papers
14
Tc max measured at ambient, thin_film, resistivity, arXiv:cond-mat/0104003, confirmed by 4 papers
Evidence (16 records from 14 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Paper |
|---|---|---|---|---|---|---|
| 6.1 | ambient | thin_film | resistivity | — | 2001 | cond-mat/0104003 |
| 4.4 | ambient | thin_film | resistivity | — | 2000 | cond-mat/0011197 |
| 4.2 | ambient | thin_film | resistivity | — | 2000 | cond-mat/0011197 |
| 3.8 | ambient | thin_film | resistivity | — | 2000 | cond-mat/0011197 |
| 2.5 | ambient | nanoparticles | susceptibility | — | 2003 | cond-mat/0308312 |
| 0.3 | ambient | thin_film | resistivity | — | 2001 | cond-mat/0108504 |
| — | ambient | thin_film | resistivity | — | 2002 | cond-mat/0209023 |
| — | ambient | thin_film | resistivity | — | 2002 | cond-mat/0209026 |
| — | ambient | thin_film | resistivity | — | 2002 | cond-mat/0209027 |
| — | ambient | thin_film | resistivity | — | 2001 | cond-mat/0103258 |
| — | ambient | thin_film | resistivity | — | 2001 | cond-mat/0108316 |
| — | ambient | thin_film | resistivity | — | 2001 | cond-mat/0110415 |
| — | ambient | thin_film | resistivity | — | 2000 | cond-mat/0007222 |
| — | ambient | thin_film | resistivity | — | 1999 | cond-mat/9904168 |
| — | ambient | thin_film | resistivity | — | 1999 | cond-mat/9909370 |
| — | ambient | thin_film | resistivity | — | 1998 | cond-mat/9808132 |
Structure
- Crystal structure
- amorphous
- Space group
- R-3m
- Lattice a (Å)
- 4.546
- Lattice c (Å)
- 11.860
Superconducting parameters
- Hc2
- 0.0 T (0 K, H perpendicular to film)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- amorphous Ge
- Pressure type
- none
- Doping type
- none