Tc max
4.2 K
Tc ambient
—
arXiv year
2017
Papers
3
Tc exp.
4.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.122.017002
Overlayer
bi
Substrate
ni
Evidence (3 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.2 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevLett.122.017002 |
| 3.8 | — | thin_film | resistivity | p-wave | 2023 | T1 | DOI: 10.1103/PhysRevB.108.064501 |
| — |
Superconducting parameters
- Hc2
- 1.6 T (1.6 K, out-of-plane)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- MgO