Tc max
1.6 K
Tc ambient
1.6 K
arXiv year
1996
Papers
2
Tc exp.
1.6 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.54.R15649
Overlayer
bi
Substrate
sb
Evidence (7 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 1.6 | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.54.R15649 |
| 1.4 | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.54.R15649 |
| 1.1 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- Sb