Tc max
11.0 K
Tc ambient
3.2 K
arXiv year
2011
Papers
32
Tc exp.
11.0 K
Tc theo.
0.1 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1808.06805, confirmed by 2 papers
Evidence (40 records from 32 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 80.0 | — | — | — | — | 2012 | T1 | 1211.0288 |
| 11.0 | — | thin_film | resistivity | — | 2018 | — | 1808.06805 |
| 10.6 | — | thin_film | resistivity | — | 2018 | — | 1808.06805 |
| 9.0 | — | thin_film | muSR | — | 2020 | T1 | 2003.12104 |
| 8.5 | 16.0 | single_crystal | — | — | 2013 | T1 | 1303.0224 |
| 8.0 | ambient | thin_film | resistivity | p-wave | 2013 | T1 | 1303.0652 |
| 7.0 | — | — | STM | — | 2016 | T1 | 1607.07731 |
| 7.0 | 30.0 | single_crystal | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.111.087001 |
| 7.0 | 30.0 | single_crystal | resistivity | — | 2013 | T1 | 1302.6488 |
| 7.0 | 50.1 | single_crystal | resistivity | — | 2013 | T1 | 1302.6488 |
| 6.5 | 21.0 | single_crystal | — | — | 2013 | T1 | 1303.0224 |
| 4.4 | 12.0 | single_crystal | — | — | 2013 | T1 | 1303.0224 |
| 3.8 | — | — | — | — | 2019 | T1 | 1905.10080 |
| 3.2 | — | — | — | — | 2015 | T1 | 1512.03519 |
| 2.7 | — | — | resistivity | — | 2011 | T1 | 1111.3445 |
| 2.0 | — | — | STM | — | 2016 | T1 | 1607.07731 |
| 2.0 | — | single_crystal | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.84.165120 |
| 1.0 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.86.134504 |
| 0.5 | 13.6 | single_crystal | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.111.087001 |
| 0.5 | 13.6 | single_crystal | resistivity | — | 2013 | T1 | 1302.6488 |
| 0.3 | 11.9 | single_crystal | resistivity | — | 2013 | T1 | 1302.6488 |
| 0.1 | — | thin_film | — | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.085414 |
| 0.0 | — | thin_film | resistivity | — | 2012 | T2 | 1206.6178 |
| — | — | — | — | — | 2025 | T1 | DOI: 10.1103/PhysRevB.111.094523 |
| — | — | — | — | p-wave | 2024 | — | 2412.14534 |
| — | — | — | — | s-wave | 2024 | T3 | 2411.12991 |
| — | — | thin_film | resistivity | — | 2023 | T3 | 2311.16489 |
| — | — | — | ARPES | — | 2020 | T3 | 2006.01716 |
| — | — | — | STM | p-wave | 2018 | T2 | 1805.12330 |
| — | — | thin_film | STM | — | 2017 | T1 | 1708.00998 |
| — | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.035307 |
| — | — | — | STM | s-wave | 2016 | T1 | 1604.07430 |
| — | — | thin_film | ARPES | — | 2016 | T1 | 1606.03400 |
| — | — | — | resistivity | — | 2015 | T2 | 1512.09098 |
| — | — | thin_film | resistivity | — | 2014 | T1 | 1409.2975 |
| — | — | thin_film | STM | — | 2014 | T1 | DOI: 10.1103/PhysRevLett.112.217001 |
| — | — | — | — | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.081404 |
| — | — | thin_film | ARPES | s-wave | 2013 | T1 | 1309.6676 |
| — | — | single_crystal | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevLett.109.056803 |
| — | — | single_crystal | resistivity | — | 2011 | — | 1101.2352 |
Structure
- Crystal structure
- hexagonal
- Space group
- C2/m (bcc-like)
- Lattice c (Å)
- 28.800
Superconducting parameters
- Gap structure
- full_gap
- Hc2
- 4.0 T (at Tc)
- λ_eph (e–ph coupling)
- 0.32
Samples & pressure
- Substrate
- NbN
- Doping level
- 0.120