Tc max
32.0 K
Tc ambient
21.5 K
arXiv year
1999
Papers
4
Tc exp.
32.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at single_crystal, resistivity, DOI: 10.1103/PhysRevB.68.184504, confirmed by 4 papers
Evidence (4 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 32.0 | — | single_crystal | resistivity | d-wave | 2003 | T1 | DOI: 10.1103/PhysRevB.68.184504 |
| 21.5 | — | polycrystal | resistivity | — | 2000 | T2 | cond-mat/0001339 |
| 20.0 | — | thin_film | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevB.71.174503 |
| 8.2 | ambient | single_crystal | resistivity | — | 1999 | T1 | DOI: 10.1103/PhysRevLett.82.3148 |
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SrTiO3
- Doping type
- hole
- Doping level
- 0.360