Tc max
30.0 K
Tc ambient
20.0 K
arXiv year
2003
Papers
4
Tc exp.
30.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.71.174503, confirmed by 4 papers
Evidence (6 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 30.0 | — | thin_film | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevB.71.174503 |
| 20.0 | — | single_crystal | susceptibility | — | 2009 | T1 | 0906.1823 |
| 18.5 | — | thin_film | resistivity | — | 2003 | T1 | cond-mat/0309131 |
| 18.0 | — | single_crystal | susceptibility | — | 2021 | T1 | DOI: 10.1103/PhysRevB.104.014515 |
| 17.5 | — | thin_film | resistivity | — | 2003 | T1 | cond-mat/0309131 |
| 14.0 | — | thin_film | resistivity | — | 2003 | T1 | cond-mat/0309131 |
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3
- Doping type
- hole
- Doping level
- 0.200