Tc max
89.0 K
Tc ambient
—
arXiv year
1996
Papers
2
Tc exp.
89.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.54.R15665, confirmed by 2 papers
Evidence (8 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 89.0 | — | thin_film | resistivity | d-wave | 1996 | T1 | DOI: 10.1103/PhysRevB.54.R15665 |
| 89.0 | — | thin_film | resistivity | d-wave | 1996 | T1 | cond-mat/9611010 |
| 85.0 | — | single_crystal | ARPES | d-wave | 1996 | T1 | DOI: 10.1103/PhysRevB.54.R15665 |
| 85.0 | — | single_crystal | resistivity | d-wave | 1996 | T1 | cond-mat/9611010 |
| 78.0 | — | thin_film | resistivity | d-wave | 1996 | T1 | DOI: 10.1103/PhysRevB.54.R15665 |
| 78.0 | — | thin_film | resistivity | d-wave | 1996 | T1 | cond-mat/9611010 |
| 46.0 | — | thin_film | resistivity | d-wave | 1996 | T1 | DOI: 10.1103/PhysRevB.54.R15665 |
| 46.0 | — | thin_film | resistivity | d-wave | 1996 | T1 | cond-mat/9611010 |
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film