Tc max
110.0 K
Tc ambient
110.0 K
arXiv year
1994
Papers
1
Tc exp.
110.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.49.6913
Evidence (3 records from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 110.0 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.6913 |
| 100.0 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.6913 |
| 86.5 |
Structure
- Crystal structure
- Bi-2:2:2:3
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- LaAlO3