Tc max
5.2 K
Tc ambient
5.2 K
arXiv year
2011
Papers
3
Tc exp.
5.2 K
Tc theo.
4.5 K
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.83.140501, confirmed by 3 papers
Evidence (5 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.2 | — | polycrystal | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.83.140501 |
| 4.5 | — | — | — | — | 2011 | T1 | 1105.5246 |
| 4.2 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevMaterials.8.074805 |
| 4.1 | — | polycrystal | — | — | 2011 | T1 | 1105.5246 |
| 4.1 | — | powder | susceptibility | — | 2011 | T1 | DOI: 10.1103/PhysRevB.83.140501 |
Structure
- Crystal structure
- orthorhombic
- Space group
- Pnma
- Lattice a (Å)
- 8.879
- Lattice c (Å)
- 4.099
Superconducting parameters
- Hc2
- 11.0 T (0.4 K)
- λ_eph (e–ph coupling)
- 1.23
- ω_log
- 128 K