Tc max
0.8 K
Tc ambient
0.8 K
arXiv year
1999
Papers
2
Tc exp.
0.8 K
Tc theo.
—
Evidence
mixed
Tc max measured at thin_film, resistivity, arXiv:cond-mat/9909329
Evidence (3 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.8 | — | thin_film | resistivity | — | 1999 | T1 | cond-mat/9909329 |
| 0.3 | — | thin_film | resistivity | — | 1999 | T1 | cond-mat/9909329 |
| — | — |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- glass