Tc max
4.0 K
Tc ambient
4.0 K
arXiv year
2008
Papers
4
Tc exp.
4.0 K
Tc theo.
6.8 K
Evidence
mixed
Tc max measured at thin_film, resistivity, arXiv:1508.07079
Evidence (5 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.8 | — | — | — | — | 2016 | T1 | 1601.06111 |
| 4.0 | — | thin_film | resistivity | — | 2015 | T1 | 1508.07079 |
| 2.0 | — |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- SiC