Tc max
41.6 K
Tc ambient
—
arXiv year
2009
Papers
6
Tc exp.
—
Tc theo.
41.6 K
Evidence
theoretical
Tc max measured at theoretical (DFT/computational), thin_film, DOI: 10.1103/PhysRevMaterials.6.024803, confirmed by 3 papers
Evidence (7 records from 6 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 48.0 | ambient | polycrystal | — | — | 2009 | T1 | DOI: 10.1103/PhysRevB.80.064503 |
| 41.6 | — | thin_film | — | — | 2022 | T1 | DOI: 10.1103/PhysRevMaterials.6.024803 |
| 41.6 |
Structure
- Crystal structure
- simple hexagonal
- Lattice a (Å)
- 3.185
- Lattice c (Å)
- 4.060
Superconducting parameters
- λ_eph (e–ph coupling)
- 1.67
- ω_log
- 580 K
Samples & pressure
- Sample form
- thin_film