Tc max
2.0 K
Tc ambient
2.0 K
arXiv year
2016
Papers
4
Tc exp.
2.0 K
Tc theo.
5.2 K
Evidence
mixed
Tc max measured at single_crystal, resistivity, arXiv:1607.07603
Evidence (6 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.2 | — | — | — | — | 2019 | T1 | 1904.00650 |
| 5.2 | — | — | — | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.104520 |
| 2.0 | — | single_crystal | resistivity, susceptibility, specific_heat | — | 2016 | T1 | 1607.07603 |
| 1.3 | — | — | — | — | 2019 | T1 | 1904.00650 |
| 1.3 | — | — | — | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.104520 |
| — | — | — | — | — | 2018 | T3 | 1812.01995 |
Structure
- Crystal structure
- ZrSi2 structure type
- Space group
- Cmcm (#63)
- Lattice a (Å)
- 4.782
- Lattice c (Å)
- 4.606
Superconducting parameters
- λ_eph (e–ph coupling)
- 0.94
- ω_log
- 80 K