Tc max
40.0 K
Tc ambient
—
arXiv year
1997
Papers
9
Tc exp.
40.0 K
Tc theo.
—
Evidence
mixed
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.115.147001
Evidence (9 records from 9 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 40.0 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevLett.115.147001 |
| 20.5 | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.97.045114 |
| — |
Structure
- Crystal structure
- P4/mmm
- Space group
- P4/mmm
- Phase
- infinite_layer
- Lattice a (Å)
- 3.860
- Lattice c (Å)
- 3.200
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- 0.40
Samples & pressure
- Sample form
- thin_film
- Substrate
- (LaAlO3)0.3(SrAl0.5Ta0.5O3)0.7
- Doping level
- 0.140