Tc max
1.0 K
Tc ambient
0.5 K
arXiv year
2015
Papers
12
Tc exp.
1.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at single_crystal, resistivity, DOI: 10.1103/PhysRevB.99.125305, confirmed by 3 papers
Evidence (13 records from 12 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.0 | 21.3 | — | resistivity | — | 2016 | T1 | 1502.02509 |
| 2.0 | 8.5 | — | resistivity | — | 2016 | T1 | 1502.02509 |
| 1.0 | — | single_crystal | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.125305 |
| 1.0 | ambient | — | resistivity | unknown | 2018 | T1 | 1811.02475 |
| 0.8 | — | polycrystal | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.120.177704 |
| 0.7 | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevResearch.2.032002 |
| 0.5 | ambient | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.094512 |
| — | — | single_crystal | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevB.107.224513 |
| — | — | — | — | — | 2022 | T3 | 2205.15995 |
| — | — | single_crystal | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevLett.126.027001 |
| — | ambient | thin_film | resistivity | — | 2018 | T1 | 1811.06133 |
| — | — | thin_film | resistivity | — | 2018 | — | 1801.04365 |
| — | — | single_crystal | STM | p-wave | 2015 | — | 1501.00418 |
Structure
- Crystal structure
- tetragonal
- Space group
- I41/acd
- Lattice a (Å)
- 12.680
- Lattice c (Å)
- 25.308
Superconducting parameters
- Hc2
- 0.1 T (at 60 mK)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SiO2
- Pressure type
- none