Tc max
0.5 K
Tc ambient
0.5 K
arXiv year
1997
Papers
2
Tc exp.
0.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, polycrystal, susceptibility, DOI: 10.1103/PhysRevB.66.224502
Evidence (5 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.5 | ambient | polycrystal | susceptibility | unknown | 2002 | T1 | DOI: 10.1103/PhysRevB.66.224502 |
| 0.4 | ambient | polycrystal | susceptibility | unknown | 2002 | T1 | DOI: 10.1103/PhysRevB.66.224502 |
| 0.2 | ambient | polycrystal | susceptibility | unknown | 2002 | T1 | DOI: 10.1103/PhysRevB.66.224502 |
| 0.1 | ambient | polycrystal | susceptibility | unknown | 2002 | T1 | DOI: 10.1103/PhysRevB.66.224502 |
| — | — | — | resistivity | — | 1997 | T1 | DOI: 10.1103/PhysRevB.56.678 |
Structure
- Crystal structure
- ThCr2Si2-type
- Space group
- I4/mmm
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Doping level
- 0.040