Tc max
5.4 K
Tc ambient
5.4 K
arXiv year
2002
Papers
6
Tc exp.
5.4 K
Tc theo.
1.1 K
Evidence
mixed
Tc max measured at ambient, thin_film, resistivity, arXiv:1710.06114, confirmed by 3 papers
Evidence (15 records from 6 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.4 | ambient | thin_film | resistivity | — | 2017 | T1 | 1710.06114 |
| 5.1 | — | wire | resistivity | p-wave | 2013 | T3 | 1310.6595 |
| 5.0 | — | thin_film | resistivity | — | 2024 | — | 2412.19493 |
| 4.8 | — | wire | resistivity | — | 2013 | T3 | 1310.6595 |
| 1.1 | — | — | — | — | 2002 | T2 | cond-mat/0208424 |
| 1.0 | 50.0 | — | — | — | 2002 | T2 | cond-mat/0208424 |
| 0.6 | — | — | — | — | 2002 | T2 | cond-mat/0208424 |
| 0.4 | — | — | — | — | 2002 | T2 | cond-mat/0208424 |
| 0.3 | — | — | — | — | 2002 | T2 | cond-mat/0208424 |
| 0.2 | — | — | — | — | 2002 | T2 | cond-mat/0208424 |
| 0.1 | — | — | — | — | 2002 | T2 | cond-mat/0208424 |
| 0.1 | — | — | — | — | 2002 | T2 | cond-mat/0208424 |
| 0.0 | — | — | — | — | 2002 | T2 | cond-mat/0208424 |
| — | — | — | STM | — | 2022 | T3 | 2203.01393 |
| — | — | — | — | unknown | 2019 | T3 | 1902.02290 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- Si