Tc max
5.1 K
Tc ambient
5.1 K
arXiv year
1990
Papers
9
Tc exp.
5.1 K
Tc theo.
0.1 K
Evidence
mixed
Tc max measured at wire, resistivity, arXiv:1310.6595
Evidence (9 records from 9 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.1 | — | wire | resistivity | — | 2013 | T3 | 1310.6595 |
| 0.1 | — | thin_film | — | s-wave | 2024 | T1 | DOI: 10.1103/PhysRevMaterials.8.L101801 |
| — | — | — | — | — | 2025 | T3 | 2508.21281 |
| — | — | — | STM | — | 2024 | — | 2402.08895 |
| — | — | — | — | — | 2024 | T3 | 2406.16621 |
| — | — | wire | specific_heat | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.012503 |
| — | — | — | susceptibility | — | 2000 | T1 | cond-mat/0011176 |
| — | — | polycrystal | susceptibility | — | 1996 | T1 | DOI: 10.1103/PhysRevLett.77.3905 |
| — | — | thin_film | — | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.64.2172 |
Structure
- Crystal structure
- FCC
Superconducting parameters
- λ_eph (e–ph coupling)
- 0.14
Samples & pressure
- Substrate
- Nb