Tc max
15.0 K
Tc ambient
15.0 K
arXiv year
2018
Papers
2
Tc exp.
15.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, STM, arXiv:1801.09342, confirmed by 2 papers
Evidence (4 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 15.0 | — | thin_film | STM | — | 2018 | T1 | 1801.09342 |
| 2.3 | 1.8 | polycrystal | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevMaterials.6.014802 |
| 1.6 | ambient | polycrystal | resistivity | — | 2022 | T1 | DOI: 10.1103/PhysRevMaterials.6.014802 |
| 1.6 | ambient | polycrystal | susceptibility | — | 2022 | T1 | DOI: 10.1103/PhysRevMaterials.6.014802 |
Structure
- Crystal structure
- pyrite-type
- Space group
- Pa-3 (#205)
- Lattice a (Å)
- 5.787
Superconducting parameters
- Hc2
- 0.1 T (0 K)
- λ_eph (e–ph coupling)
- —
Competing orders
- T_CDW
- 145.0 K
Samples & pressure
- Substrate
- SrTiO3(001) and Bi2Sr2CaCu2O8+δ