Tc max
89.5 K
Tc ambient
89.5 K
arXiv year
1992
Papers
1
Tc exp.
89.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.45.4892
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 89.5 | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevB.45.4892 |
Structure
- Lattice c (Å)
- 11.644
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- LaAlO3
- Doping type
- hole