Tc max
93.0 K
Tc ambient
93.0 K
arXiv year
1987
Papers
34
Tc exp.
93.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.36.226, confirmed by 3 papers
Evidence (39 records from 34 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 96.0 | ambient | polycrystal | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.5828 |
| 93.0 | — | polycrystal | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.226 |
| 93.0 | — | polycrystal | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.2394 |
| 92.0 | — | polycrystal | — | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.65.915 |
| 92.0 | ambient | polycrystal | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.5828 |
| 90.2 | — | thin_film | resistivity | — | 2001 | T1 | DOI: 10.1103/PhysRevB.63.180502 |
| 90.0 | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.104501 |
| 90.0 | — | single_crystal | resistivity | — | 2001 | T1 | cond-mat/0108366 |
| 90.0 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.10047 |
| 90.0 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevLett.63.1016 |
| 90.0 | — | polycrystal | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.652 |
| 90.0 | — | polycrystal | — | — | 1988 | T1 | DOI: 10.1103/PhysRevB.38.2460 |
| 88.0 | ambient | single_crystal | resistivity | — | 2011 | T1 | 1103.0858 |
| 88.0 | ambient | single_crystal | resistivity | — | 2008 | T1 | 0803.1808 |
| 88.0 | — | thin_film | resistivity | d-wave | 1997 | T1 | DOI: 10.1103/PhysRevLett.79.4890 |
| 88.0 | — | thin_film | resistivity | d-wave | 1997 | T1 | cond-mat/9703185 |
| 88.0 | — | thin_film | — | — | 1997 | T1 | cond-mat/9709005 |
| 87.1 | — | polycrystal | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.1604 |
| 85.0 | — | thin_film | susceptibility | d-wave | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.237001 |
| 82.0 | — | thin_film | resistivity | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.104501 |
| 79.0 | — | thin_film | susceptibility | d-wave | 2020 | T1 | DOI: 10.1103/PhysRevMaterials.4.124801 |
| 72.0 | — | thin_film | susceptibility | d-wave | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.237001 |
| 71.0 | — | thin_film | resistivity | — | 1997 | T1 | DOI: 10.1103/PhysRevLett.78.1134 |
| 70.0 | — | thin_film | resistivity | d-wave | 2001 | T1 | DOI: 10.1103/PhysRevB.64.220505 |
| 70.0 | — | thin_film | resistivity | d-wave | 2001 | T1 | cond-mat/0108313 |
| 52.0 | — | thin_film | susceptibility | d-wave | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.237001 |
| 40.0 | — | thin_film | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevB.47.11619 |
| 2.0 | — | thin_film | resistivity | — | 1993 | T1 | DOI: 10.1103/PhysRevB.47.11619 |
| — | — | thin_film | — | — | 2020 | T1 | 2012.03559 |
| — | — | single_crystal | susceptibility | — | 2007 | T1 | DOI: 10.1103/PhysRevB.75.174515 |
| — | — | thin_film | — | — | 2005 | T1 | cond-mat/0510149 |
| — | — | thin_film | STM | — | 2004 | T1 | cond-mat/0407306 |
| — | — | — | resistivity | — | 2004 | T1 | cond-mat/0407463 |
| — | — | — | resistivity | — | 2001 | T1 | cond-mat/0102192 |
| — | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0002377 |
| — | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0011277 |
| — | — | single_crystal | — | — | 1997 | T1 | DOI: 10.1103/PhysRevB.56.3413 |
| — | — | single_crystal | susceptibility | — | 1996 | T1 | DOI: 10.1103/PhysRevB.54.3514 |
| — | — | single_crystal | — | — | 1995 | T1 | DOI: 10.1103/PhysRevB.52.15621 |
Structure
- Crystal structure
- orthorhombic
- Phase
- cuprate_123
Superconducting parameters
- Pairing symmetry
- d-wave
- Gap structure
- nodal
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- hole
- Doping level
- 0.000