Tc max
19.0 K
Tc ambient
19.0 K
arXiv year
2013
Papers
1
Tc exp.
19.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, arXiv:1303.2855
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 19.0 | — | polycrystal | resistivity | — | 2013 | T1 | 1303.2855 |
Structure
- Crystal structure
- ThCr2Si2-type tetragonal
- Space group
- I4/mmm
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- polycrystal
- Doping type
- isovalent
- Doping level
- 0.160