Tc max
95.0 K
Tc ambient
94.8 K
arXiv year
1987
Papers
30
Tc exp.
95.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.38.6588, confirmed by 2 papers
Evidence (34 records from 30 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 180.0 | — | single_crystal | infrared | — | 2010 | T1 | 1009.2925 |
| 95.0 | — | polycrystal | resistivity, susceptibility | — | 1988 | T1 | DOI: 10.1103/PhysRevB.38.6588 |
| 94.8 | — | polycrystal | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.5164 |
| 94.8 | — | polycrystal | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.44.6999 |
| 94.5 | — | single_crystal | susceptibility | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.054508 |
| 94.5 | — | polycrystal | — | — | 1988 | T1 | DOI: 10.1103/PhysRevB.38.4592 |
| 94.4 | — | polycrystal | susceptibility | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.9742 |
| 93.7 | — | polycrystal | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.9108 |
| 93.0 | — | polycrystal | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.226 |
| 93.0 | — | polycrystal | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.2394 |
| 92.0 | ambient | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevB.70.064504 |
| 92.0 | — | — | — | — | 2001 | T1 | cond-mat/0102337 |
| 92.0 | — | polycrystal | — | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.65.915 |
| 92.0 | — | polycrystal | resistivity, susceptibility, specific_heat | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.1580 |
| 92.0 | — | polycrystal | susceptibility | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.5820 |
| 91.0 | — | thin_film | susceptibility | — | 2004 | T1 | DOI: 10.1103/PhysRevB.69.104531 |
| 90.0 | — | — | — | — | 2001 | T1 | cond-mat/0102337 |
| 90.0 | — | thin_film | resistivity | — | 1996 | T1 | supr-con/9607003 |
| 90.0 | — | single_crystal | — | — | 1992 | T1 | DOI: 10.1103/PhysRevB.46.11847 |
| 90.0 | — | polycrystal | resistivity, susceptibility | — | 1988 | T1 | DOI: 10.1103/PhysRevB.38.9220 |
| 90.0 | — | polycrystal | — | — | 1988 | T1 | DOI: 10.1103/PhysRevB.38.2460 |
| 89.0 | ambient | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.87.165140 |
| 88.0 | — | thin_film | resistivity | — | 1996 | T1 | supr-con/9607003 |
| 88.0 | — | thin_film | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.3496 |
| 87.0 | — | thin_film | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevB.52.R3872 |
| 83.2 | — | polycrystal | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.1604 |
| 82.0 | — | thin_film | resistivity | — | 1995 | T1 | DOI: 10.1103/PhysRevB.52.R3872 |
| 81.0 | — | — | resistivity | — | 2025 | T2 | 2509.13668 |
| 80.5 | — | thin_film | resistivity | — | 1996 | T1 | supr-con/9607003 |
| 1.0 | — | polycrystal | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevB.38.2930 |
| — | — | thin_film | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.62.8707 |
| — | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.54.101 |
| — | — | polycrystal | susceptibility | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.6948 |
| — | — | powder | susceptibility | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.8309 |
Structure
- Crystal structure
- orthorhombic
- Space group
- Pmmm
- Phase
- cuprate_123
- Lattice a (Å)
- 3.821
- Lattice c (Å)
- 11.610
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- hole
- Doping level
- 0.000