Tc max
18.0 K
Tc ambient
—
arXiv year
2009
Papers
3
Tc exp.
18.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at single_crystal, STM, DOI: 10.1103/PhysRevB.80.180507, confirmed by 3 papers
Evidence (4 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 18.0 | — | single_crystal | STM | — | 2009 | T1 | DOI: 10.1103/PhysRevB.80.180507 |
| 14.0 | — | single_crystal | resistivity, STM | — | 2009 | T1 | 0910.1485 |
| 14.0 | — | single_crystal | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevB.80.180507 |
| 11.0 | — | thin_film | resistivity | — | 2009 | T1 | 0904.1502 |
Structure
- Lattice a (Å)
- 3.800
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- single_crystal