Tc max
4.6 K
Tc ambient
4.5 K
arXiv year
2015
Papers
26
Tc exp.
4.6 K
Tc theo.
5.0 K
Evidence
experimental
Tc max measured at thin_film, STM, arXiv:1709.08789, confirmed by 2 papers
Evidence (49 records from 26 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.0 | — | thin_film | — | — | 2021 | T1 | DOI: 10.1103/PhysRevB.103.224517 |
| 4.8 | — | — | — | — | 2015 | T1 | 1509.04851 |
| 4.6 | — |
Structure
- Crystal structure
- tetragonal
- Space group
- P4/nmm
- Lattice c (Å)
- 5.031
Superconducting parameters
- Gap structure
- nodal
- Hc2
- 2.8 T (0 K)
- λ_eph (e–ph coupling)
- —
Competing orders
- Competing order
- AFM
- T_AFM
- 20.0 K
Samples & pressure
- Sample form
- single_crystal
- Substrate
- SrTiO3
- Pressure type
- none
- Doping type
- none