Tc max
22.1 K
Tc ambient
22.1 K
arXiv year
2015
Papers
5
Tc exp.
22.1 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1608.01170, confirmed by 4 papers
Evidence (7 records from 5 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 22.1 | — | thin_film | resistivity | — | 2016 | T1 | 1608.01170 |
| 20.9 | — | thin_film | resistivity | — | 2015 | — | 1502.00758 |
| 20.8 | — | thin_film | resistivity | — | 2016 | T1 | 1608.01170 |
| 19.9 | — | thin_film | resistivity | — | 2015 | — | 1502.00758 |
| 19.0 | — | thin_film | — | — | 2017 | — | 1706.02898 |
| 7.3 | — | — | resistivity | — | 2021 | T1 | 2112.03956 |
| — | — | thin_film | resistivity | s_pm | 2018 | — | 1809.05240 |
Structure
- Lattice a (Å)
- 3.753
- Lattice c (Å)
- 5.784
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Competing orders
- ρ(T) exponent
- 2.00
Samples & pressure
- Sample form
- thin_film
- Substrate
- CaF2
- Doping type
- isovalent
- Doping level
- 0.300