Tc max
11.8 K
Tc ambient
11.7 K
arXiv year
2008
Papers
4
Tc exp.
11.8 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:0904.4731, confirmed by 4 papers
Evidence (6 records from 4 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 11.8 | — | thin_film | resistivity | — | 2009 | T1 | 0904.4731 |
| 11.7 | — | thin_film | resistivity | — | 2010 | T1 | 1005.0192 |
| 10.0 | — | polycrystal | resistivity, susceptibility | — | 2011 | — | 1108.5069 |
| 8.1 | — | thin_film | resistivity | — | 2010 | T1 | 1005.0192 |
| 8.0 | — | — | susceptibility | — | 2008 | T1 | 0809.0128 |
| 3.4 | — | thin_film | resistivity | — | 2009 | T1 | 0904.4731 |
Structure
- Crystal structure
- tetragonal
- Lattice a (Å)
- 3.769
- Lattice c (Å)
- 5.490
Superconducting parameters
- Hc2
- 50.0 T (0 K, H parallel to substrate plane)
- λ_eph (e–ph coupling)
- —
Competing orders
- T_SDW
- 120.0 K
- T_AFM
- 78.0 K
Samples & pressure
- Sample form
- thin_film
- Substrate
- MgO