Tc max
38.0 K
Tc ambient
22.6 K
arXiv year
2015
Papers
5
Tc exp.
38.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1805.02380, confirmed by 3 papers
Evidence (11 records from 5 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 38.0 | — | thin_film | resistivity | — | 2018 | T1 | 1805.02380 |
| 22.8 | — | thin_film | resistivity | — | 2015 | — | 1502.00758 |
| 22.6 | — | thin_film | resistivity | — | 2016 | T1 | 1608.01170 |
| 20.5 | — | thin_film | resistivity | — | 2015 | — | 1502.00758 |
| 20.3 | — | thin_film | resistivity | — | 2016 | T1 | 1608.01170 |
| 19.0 | — | thin_film | resistivity | — | 2018 | T1 | 1805.02380 |
| 12.0 | — | thin_film | resistivity | — | 2018 | T1 | 1805.02380 |
| 8.0 | — | thin_film | resistivity | — | 2018 | T1 | 1805.02380 |
| — | — | thin_film | susceptibility | — | 2021 | T1 | DOI: 10.1103/PhysRevB.104.014505 |
| — | — | thin_film | resistivity | — | 2021 | T1 | 2103.13659 |
| — | — | thin_film | resistivity | — | 2015 | — | 1502.00758 |
Structure
- Lattice a (Å)
- 3.749
- Lattice c (Å)
- 5.710
Superconducting parameters
- Hc2
- 55.4 T (0 K, H parallel c)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- CaF2
- Doping type
- isovalent
- Doping level
- 0.200