Tc max
16.0 K
Tc ambient
10.0 K
arXiv year
2008
Papers
10
Tc exp.
16.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at P=2.4 GPa, polycrystal, susceptibility, DOI: 10.1103/PhysRevB.85.064517, confirmed by 2 papers
Evidence (13 records from 10 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 27.0 | 1.5 | — | — | — | 2008 | — | 0807.4610 |
| 16.0 | 2.4 | polycrystal | susceptibility | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.064517 |
| 13.5 | ambient | — | — | — | 2008 | — | 0807.4610 |
| 12.8 | 0.8 | polycrystal | muSR | — | 2010 | T1 | DOI: 10.1103/PhysRevLett.104.087004 |
| 10.0 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevLett.108.267002 |
| 8.3 | ambient | polycrystal | muSR | — | 2010 | T1 | DOI: 10.1103/PhysRevLett.104.087004 |
| 8.0 | ambient | polycrystal | susceptibility | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.064517 |
| 8.0 | ambient | polycrystal | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevB.79.014519 |
| 8.0 | — | thin_film | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.103.117002 |
| 8.0 | ambient | polycrystal | resistivity | — | 2008 | — | 0811.1215 |
| — | — | — | susceptibility | — | 2011 | T1 | 1112.2602 |
| — | — | — | magnetization | — | 2010 | — | 1002.2510 |
| — | — | — | muSR | — | 2009 | — | 0912.0471 |
Structure
- Crystal structure
- orthorhombic
- Space group
- Cmme
- Lattice a (Å)
- 3.780
- Lattice c (Å)
- 5.540
Superconducting parameters
- Gap structure
- multi_gap
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- polycrystal
- Substrate
- MgO