Tc max
20.5 K
Tc ambient
17.3 K
arXiv year
2009
Papers
16
Tc exp.
20.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.93.054503, confirmed by 3 papers
Evidence (18 records from 16 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 20.5 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.054503 |
| 18.0 | — | thin_film | resistivity | — | 2025 | T1 | 2510.15537 |
| 17.3 | — | thin_film | resistivity | — | 2013 | T1 | 1303.2586 |
| 16.6 | — | thin_film | resistivity | — | 2025 | T1 | 2510.15537 |
| 13.6 | — | single_crystal | susceptibility | — | 2013 | T1 | 1303.2586 |
| — | — | — | resistivity | — | 2025 | — | 2505.12249 |
| — | — | thin_film | resistivity | — | 2025 | T1 | 2510.09921 |
| — | — | — | resistivity | — | 2024 | T1 | 2409.12847 |
| — | — | — | susceptibility | — | 2023 | — | 2307.10722 |
| — | ambient | — | susceptibility | — | 2022 | T3 | 2208.00642 |
| — | — | thin_film | STM | s_pm | 2022 | T1 | 2209.04982 |
| — | — | — | STM | s_pm | 2022 | T1 | 2209.08683 |
| — | — | — | susceptibility | — | 2021 | T1 | 2101.07940 |
| — | — | thin_film | resistivity | — | 2017 | T3 | 1712.02558 |
| — | — | thin_film | resistivity | — | 2017 | T1 | 1709.05089 |
| — | — | thin_film | resistivity | — | 2013 | T1 | 1309.1044 |
| — | — | — | — | s_pm | 2010 | — | 1002.3358 |
| — | — | wire | resistivity | — | 2009 | T1 | 0906.1636 |
Superconducting parameters
- Pairing symmetry
- s_pm
- Gap structure
- multi_gap
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- CaF2
- Pressure type
- none