Tc max
20.5 K
Tc ambient
17.3 K
arXiv year
2009
Papers
18
Tc exp.
20.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.93.054503
Evidence (20 records from 18 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 20.5 | — | thin_film | resistivity | — | 2016 | T1 | DOI: 10.1103/PhysRevB.93.054503 |
| 18.0 | — | thin_film | resistivity | — | 2025 | T1 | 2510.15537 |
| 17.3 |
Superconducting parameters
- Pairing symmetry
- s_pm
- Gap structure
- multi_gap
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- CaF2
- Pressure type
- none