Tc max
40.0 K
Tc ambient
40.0 K
arXiv year
2009
Papers
15
Tc exp.
13.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at ambient, thin_film, STM, arXiv:2603.21959, confirmed by 2 papers
Evidence (19 records from 15 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 40.0 | ambient | thin_film | STM | — | 2026 | T1 | 2603.21959 |
| 13.5 | — | — | resistivity | — | 2026 | T1 | 2603.16115 |
| 13.0 | — | thin_film | resistivity, susceptibility | — | 2010 | T1 | DOI: 10.1103/PhysRevLett.104.017003 |
| 13.0 | — | thin_film | resistivity, susceptibility | — | 2009 | T1 | 0911.5282 |
| 12.5 | — | thin_film | resistivity | — | 2013 | T2 | 1301.4696 |
| 11.0 | — | thin_film | resistivity | — | 2025 | — | 2503.11502 |
| 11.0 | — | thin_film | resistivity | — | 2010 | T1 | 1009.6035 |
| 10.6 | — | thin_film | resistivity | — | 2009 | T1 | 0911.5282 |
| 10.0 | — | thin_film | — | — | 2026 | T1 | 2602.14398 |
| 10.0 | — | thin_film | resistivity, susceptibility | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.020508 |
| 9.1 | — | thin_film | resistivity | — | 2010 | T1 | DOI: 10.1103/PhysRevLett.104.017003 |
| 9.1 | — | thin_film | resistivity | — | 2009 | T1 | 0911.5282 |
| 8.0 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.214517 |
| 6.0 | — | thin_film | STM | — | 2017 | — | 1606.03249 |
| — | — | thin_film | neutron, muSR | — | 2025 | — | 2503.11502 |
| — | — | — | — | — | 2025 | — | 2502.01838 |
| — | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevMaterials.8.L041801 |
| — | — | thin_film | susceptibility, resistivity | — | 2019 | T1 | 1906.09418 |
| — | — | thin_film | — | — | 2011 | — | 1102.2155 |
Structure
- Crystal structure
- tetragonal
- Lattice c (Å)
- 6.258
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Competing orders
- T_AFM
- 57.0 K
Samples & pressure
- Sample form
- thin_film
- Substrate
- SrTiO3