Tc max
95.0 K
Tc ambient
89.4 K
arXiv year
1987
Papers
3
Tc exp.
95.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevLett.58.1891, confirmed by 3 papers
Evidence (4 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 95.0 | — | polycrystal | resistivity, susceptibility | — | 1987 | T1 | DOI: 10.1103/PhysRevLett.58.1891 |
| 92.0 | — | polycrystal | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevLett.58.1891 |
| 89.4 | — | thin_film | susceptibility | — | 2000 | T1 | cond-mat/0003213 |
| 89.4 | — | thin_film | susceptibility | — | 2000 | T1 | DOI: 10.1103/PhysRevLett.85.3708 |
Structure
- Crystal structure
- tetragonal
- Phase
- cuprate_123
- Lattice a (Å)
- 3.890
- Lattice c (Å)
- 11.730
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- MgO