Tc max
6.0 K
Tc ambient
—
arXiv year
1986
Papers
10
Tc exp.
6.0 K
Tc theo.
4.0 K
Evidence
mixed
Tc max measured at resistivity, arXiv:2109.01364, confirmed by 3 papers
Evidence (12 records from 10 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.8 | 4.6 | — | resistivity | — | 2024 | — | 2401.09625 |
| 6.0 | — | — | resistivity | — | 2021 | — | 2109.01364 |
| 6.0 | 9.0 | polycrystal | susceptibility | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.020507 |
| 5.0 | 10.1 | single_crystal | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.102.237001 |
| 5.0 | 8.7 | single_crystal | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.102.237001 |
| 4.0 | 75.0 | — | — | — | 1988 | T1 | DOI: 10.1103/PhysRevB.37.3304 |
| 3.4 | 26.0 | polycrystal | susceptibility | — | 2010 | T1 | DOI: 10.1103/PhysRevB.82.020507 |
| 2.0 | — | — | resistivity | — | 2026 | T2 | 2602.21364 |
| 0.4 | — | — | — | — | 2004 | T2 | cond-mat/0404447 |
| — | — | thin_film | — | p-wave | 2019 | T1 | DOI: 10.1103/PhysRevB.99.201106 |
| — | — | thin_film | — | — | 2018 | — | 1802.06272 |
| — | — | — | — | — | 1986 | T1 | DOI: 10.1103/PhysRevB.34.4552 |
Structure
- Crystal structure
- beta-Sn
- Space group
- I41/amd
Superconducting parameters
- Hc2
- 1.0 T (at 0 K)
- λ_eph (e–ph coupling)
- 0.32
Samples & pressure
- Substrate
- MoS2
- Pressure type
- hydrostatic
- Doping type
- hole
- Doping level
- 0.100