Tc max
4.3 K
Tc ambient
0.5 K
arXiv year
2009
Papers
3
Tc exp.
4.3 K
Tc theo.
0.5 K
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevMaterials.5.064802, confirmed by 2 papers
Evidence (4 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.3 | — | thin_film | resistivity | — | 2021 | T1 | DOI: 10.1103/PhysRevMaterials.5.064802 |
| 0.5 | — | — | — | — | 2019 | T1 | DOI: 10.1103/PhysRevMaterials.3.054802 |
| 0.5 | ambient | thin_film | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.102.217003 |
| 0.2 | ambient | thin_film | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.102.217003 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film