Tc max
0.8 K
Tc ambient
—
arXiv year
2013
Papers
7
Tc exp.
0.8 K
Tc theo.
—
Evidence
experimental
Tc max measured at resistivity, arXiv:1510.04426
Evidence (7 records from 7 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.8 | — | — | resistivity | — | 2015 | T3 | 1510.04426 |
| — | — | thin_film | resistivity | — | 2019 | T1 | 1905.09593 |
| — | — | single_crystal | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.96.165302 |
| — | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevX.7.021011 |
| — | — | thin_film | resistivity | — | 2017 | T1 | 1706.01638 |
| — | — | thin_film | susceptibility | — | 2015 | T1 | DOI: 10.1103/PhysRevLett.114.066801 |
| — | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevX.3.021007 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- CdTe