Tc max
3.4 K
Tc ambient
3.4 K
arXiv year
1986
Papers
70
Tc exp.
4.0 K
Tc theo.
4.3 K
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.61.14833, confirmed by 2 papers
Evidence (100 records from 70 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.3 | — | — | — | — | 2023 | T1 | 2304.14682 |
| 4.0 | — | polycrystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevB.45.3133 |
| 4.0 | — | polycrystal | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.14833 |
| 4.0 | — | polycrystal | resistivity, susceptibility | — | 1992 | T1 | DOI: 10.1103/PhysRevB.45.3133 |
| 4.0 | — | polycrystal | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevB.45.3133 |
| 3.8 | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/8czc-tn4z |
| 3.6 | — | powder | susceptibility | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.214516 |
| 3.5 | — | powder | susceptibility | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.214516 |
| 3.5 | — | — | resistivity | — | 2018 | T1 | 1809.03902 |
| 3.5 | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.84.014532 |
| 3.5 | — | thin_film | resistivity | s_pm | 2011 | T1 | 1107.2252 |
| 3.5 | — | polycrystal | resistivity | — | 2000 | T1 | DOI: 10.1103/PhysRevB.61.14833 |
| 3.4 | — | thin_film | susceptibility | — | 2012 | T1 | 1209.3502 |
| 3.4 | ambient | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.012502 |
| 3.4 | — | thin_film | — | — | 2007 | T1 | 0704.1872 |
| 3.4 | — | — | resistivity | — | 2020 | — | 2003.05723 |
| 3.4 | ambient | polycrystal | susceptibility | s-wave | 2012 | T1 | 1201.1649 |
| 3.4 | — | — | resistivity | — | 2012 | T1 | 1211.4084 |
| 3.4 | ambient | — | susceptibility | — | 2011 | T1 | 1112.3083 |
| 3.4 | — | thin_film | resistivity | — | 2010 | — | 1007.2511 |
| 3.4 | — | wire | resistivity | s-wave | 2006 | — | cond-mat/0608066 |
| 3.4 | — | wire | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevLett.95.076802 |
| 3.4 | ambient | polycrystal | susceptibility | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.014524 |
| 3.4 | — | thin_film | resistivity, susceptibility | — | 1991 | T1 | DOI: 10.1103/PhysRevB.43.505 |
| 3.4 | ambient | wire | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.6455 |
| 3.4 | 0.1 | polycrystal | muSR | — | 2024 | T1 | DOI: 10.1103/PhysRevB.110.214515 |
| 3.4 | ambient | polycrystal | muSR | — | 2024 | T1 | DOI: 10.1103/PhysRevB.110.214515 |
| 3.4 | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.54.13152 |
| 3.4 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 3.4 | — | polycrystal | susceptibility | — | 2008 | T1 | DOI: 10.1103/PhysRevLett.100.147202 |
| 3.4 | — | powder | susceptibility | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.214516 |
| 3.3 | — | thin_film | susceptibility | — | 2021 | T1 | DOI: 10.1103/PhysRevLett.127.127003 |
| 3.3 | — | thin_film | resistivity, susceptibility | — | 1994 | T1 | DOI: 10.1103/PhysRevB.49.3600 |
| 3.1 | ambient | — | resistivity | — | 2022 | T1 | 2212.02034 |
| 3.1 | ambient | — | resistivity | — | 2022 | T1 | 2212.02034 |
| 3.1 | — | thin_film | STM | — | 2021 | T1 | DOI: 10.1103/PhysRevLett.127.127003 |
| 3.1 | — | — | — | — | 2026 | T2 | 2603.05123 |
| 3.0 | — | polycrystal | susceptibility | — | 2020 | T1 | 2012.06501 |
| 3.0 | — | — | susceptibility | — | 2014 | T1 | 1404.6489 |
| 2.8 | ambient | — | resistivity | — | 2022 | T1 | 2212.02034 |
| 2.8 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.110.237001 |
| 2.4 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.110.237001 |
| 2.4 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 2.4 | — | thin_film | STM | — | 2022 | T1 | DOI: 10.1103/PhysRevB.106.045423 |
| 2.3 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 2.2 | — | powder | susceptibility | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.214516 |
| 2.2 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 2.1 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 2.1 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 2.0 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 2.0 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 2.0 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 2.0 | — | thin_film | resistivity | s-wave | 2020 | T1 | DOI: 10.1103/PhysRevB.101.035304 |
| 2.0 | — | thin_film | resistivity | s-wave | 2019 | T1 | 1909.09062 |
| 2.0 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 2.0 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.024502 |
| 1.8 | — | thin_film | resistivity | — | 2017 | T1 | 1710.08212 |
| 1.6 | — | thin_film | resistivity | — | 2010 | — | 1007.2511 |
| 1.5 | — | thin_film | resistivity | — | 2017 | T1 | 1710.08212 |
| 1.4 | — | thin_film | resistivity | — | 2010 | — | 1007.2511 |
| 1.4 | — | thin_film | resistivity | — | 2010 | — | 1007.2511 |
| 1.2 | — | polycrystal | resistivity | s-wave | 2026 | T1 | 2602.08766 |
| 1.2 | — | thin_film | resistivity | — | 2021 | T3 | 2111.11934 |
| 0.9 | — | — | resistivity | — | 2021 | T1 | 2108.13761 |
| 0.5 | — | — | resistivity | — | 2020 | — | 2003.05723 |
| 0.3 | — | — | resistivity | — | 2021 | T1 | 2108.13761 |
| — | — | thin_film | resistivity | — | 2025 | T1 | DOI: 10.1103/bwp9-7dsd |
| — | — | — | resistivity | — | 2024 | T1 | 2408.01232 |
| — | 0.1 | — | muSR | — | 2024 | T1 | 2408.13857 |
| — | 1.1 | — | muSR | — | 2024 | T1 | 2408.13857 |
| — | 2.1 | — | muSR | — | 2024 | T1 | 2408.13857 |
| — | 3.0 | — | muSR | — | 2024 | T1 | 2408.13857 |
| — | — | polycrystal | resistivity | — | 2024 | T1 | 2408.14655 |
| — | — | — | resistivity | — | 2021 | T1 | 2101.02401 |
| — | — | — | resistivity | — | 2020 | — | 1905.12670 |
| — | — | thin_film | — | — | 2020 | — | 2008.12733 |
| — | — | — | susceptibility | — | 2019 | T3 | 1903.05292 |
| — | — | thin_film | muSR | — | 2018 | T1 | 1802.08299 |
| — | — | thin_film | — | — | 2015 | T1 | 1509.01119 |
| — | — | polycrystal | muSR | — | 2013 | T1 | DOI: 10.1103/PhysRevB.87.104508 |
| — | — | — | susceptibility | — | 2012 | T1 | 1205.0212 |
| — | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevLett.106.067005 |
| — | — | — | resistivity | — | 2011 | T1 | 1101.4817 |
| — | — | wire | susceptibility | — | 2010 | — | 1001.3903 |
| — | — | — | susceptibility | — | 2010 | T1 | DOI: 10.1103/PhysRevLett.104.087004 |
| — | — | — | — | s-wave | 2008 | T1 | DOI: 10.1103/PhysRevB.77.104510 |
| — | — | wire | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.045414 |
| — | — | wire | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.78.092501 |
| — | — | thin_film | — | — | 2006 | T1 | DOI: 10.1103/PhysRevLett.96.087002 |
| — | — | — | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevB.72.214507 |
| — | — | — | resistivity | — | 1999 | T2 | cond-mat/9905294 |
| — | — | — | — | — | 1998 | T2 | cond-mat/9806053 |
| — | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevB.45.895 |
| — | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevB.46.11709 |
| — | — | single_crystal | — | — | 1991 | T1 | DOI: 10.1103/PhysRevB.43.5321 |
| — | — | wire | resistivity | — | 1990 | T1 | DOI: 10.1103/PhysRevB.41.6350 |
| — | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.182 |
| — | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.719 |
| — | — | wire | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.61.2137 |
| — | — | thin_film | resistivity | — | 1986 | T1 | DOI: 10.1103/PhysRevB.34.203 |
Structure
- Crystal structure
- tetragonal
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 0.7 T (at > 1.2 K)
- λ_eph (e–ph coupling)
- 0.90
- ω_log
- 72 K
Samples & pressure
- Sample form
- thin_film
- Substrate
- Si(111)
- Pressure type
- none
- Doping type
- none