In-O

amorphous

ambient SC2D / interfacedisputed

Tc max

0.8 K

Tc ambient

0.8 K

Discovery

2000

Papers

2

Tc max measured at ambient, thin_film, resistivity, arXiv:cond-mat/0101447

Evidence (6 records from 2 papers)

the flat columns above are aggregates — each line here is one paper's claim

Tc (K)	P (GPa)	Sample	Method	Pairing	Year	Paper
0.8	ambient	thin_film	resistivity	—	2001	cond-mat/0101447
0.6	ambient	thin_film	resistivity	—	2001	cond-mat/0101447
0.4	ambient	thin_film	resistivity	—	2001	cond-mat/0101447
0.2	ambient	thin_film	resistivity	—	2001	cond-mat/0101447
0.1	ambient	thin_film	resistivity	—	2001	cond-mat/0101447
—	ambient	thin_film	resistivity	—	2000	cond-mat/0002065

Structure

Crystal structure: amorphous

Superconducting parameters

Hc2: 7.2 T (0 K)
λ_eph (e–ph coupling): —

Samples & pressure

Sample form: thin_film
Substrate: glass substrate
Pressure type: none