Tc max
1.5 K
Tc ambient
1.5 K
Discovery
2003
Papers
2
Tc max measured at ambient, thin_film, resistivity, arXiv:cond-mat/0307648
Evidence (3 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Paper |
|---|---|---|---|---|---|---|
| 1.5 | ambient | thin_film | resistivity | — | 2003 | cond-mat/0307648 |
| 1.3 | ambient | thin_film | resistivity | — | 2003 | cond-mat/0307648 |
| — | ambient | thin_film | resistivity | — | 2004 | cond-mat/0403480 |
Structure
- Crystal structure
- amorphous
Superconducting parameters
- Hc2
- 1.7 T (0.01 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- glass or sapphire
- Pressure type
- none