In₂O₃

conventional

ambient SCdisputed

Tc max

3.3 K

Tc ambient

3.3 K

arXiv year

1992

Papers

Tc exp.

3.3 K

Tc theo.

—

Evidence

experimental

Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.46.10917, confirmed by 3 papers

Evidence (16 records from 13 papers)

the flat columns above are aggregates — each line here is one paper's claim

Tc (K)	P (GPa)	Sample	Method	Pairing	Year	Tier	Paper
3.3	—	thin_film	resistivity	—	1992	T1	DOI: 10.1103/PhysRevB.46.10917
1.5	—	thin_film	resistivity	—	2004	T1	cond-mat/0410724
1.5	—	thin_film	resistivity	—	2003	T1	cond-mat/0307648
1.3	—	thin_film	resistivity	—	2003	T1	cond-mat/0307648
1.0	—	thin_film	resistivity	—	2004	T1	cond-mat/0410724
0.8	—	thin_film	resistivity	—	2004	T1	cond-mat/0410724
—	—	thin_film	resistivity	—	2019	T3	1911.02818
—	—	thin_film	STM	—	2018	T1	1806.00323
—	—	thin_film	resistivity	—	2016	T1	DOI: 10.1103/PhysRevLett.116.057001
—	ambient	thin_film	resistivity	—	2015	T3	1506.00459
—	—	thin_film	resistivity	—	2015	T1	1509.02033
—	—	thin_film	resistivity	—	2011	T1	DOI: 10.1103/PhysRevB.84.100507
—	—	thin_film	STM, resistivity	—	2010	T1	1012.3630
—	—	thin_film	resistivity	—	2006	T1	cond-mat/0602160
—	—	thin_film	resistivity	—	2005	T1	DOI: 10.1103/PhysRevLett.94.017003
—	—	thin_film	resistivity	—	2004	T1	cond-mat/0403480