Tc max
3.2 K
Tc ambient
—
arXiv year
1988
Papers
3
Tc exp.
3.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevLett.60.144, confirmed by 2 papers
Evidence (13 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 3.2 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.144 |
| 3.2 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.144 |
| 3.2 | — | thin_film | resistivity | — | 1999 | T1 | DOI: 10.1103/PhysRevLett.82.831 |
| 3.1 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.144 |
| 3.0 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.144 |
| 3.0 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.144 |
| 2.9 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.144 |
| 2.8 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.144 |
| 2.8 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.144 |
| 2.8 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.144 |
| 2.6 | — | thin_film | resistivity | — | 1988 | T1 | DOI: 10.1103/PhysRevLett.60.144 |
| 2.5 | — | thin_film | resistivity | — | 1999 | T1 | DOI: 10.1103/PhysRevLett.82.831 |
| — | — | thin_film | resistivity | — | 1999 | T1 | DOI: 10.1103/PhysRevB.60.3544 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire