Tc max
2.2 K
Tc ambient
2.2 K
arXiv year
2011
Papers
3
Tc exp.
2.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:2406.09607, confirmed by 3 papers
Evidence (11 records from 3 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 2.2 | — | thin_film | resistivity | s-wave | 2024 | T1 | 2406.09607 |
| 2.2 | — | thin_film | resistivity | s-wave | 2024 | T1 | 2406.09607 |
| 2.1 | — | thin_film | resistivity | s-wave | 2025 | T1 | DOI: 10.1103/PhysRevApplied.23.034007 |
| 2.1 | — | thin_film | resistivity | s-wave | 2024 | T1 | 2406.09607 |
| 2.1 | — | thin_film | resistivity | s-wave | 2024 | T1 | 2406.09607 |
| 2.1 | — | thin_film | resistivity | s-wave | 2024 | T1 | 2406.09607 |
| 2.1 | — | thin_film | resistivity | s-wave | 2024 | T1 | 2406.09607 |
| 2.0 | — | thin_film | resistivity | s-wave | 2024 | T1 | 2406.09607 |
| 2.0 | — | thin_film | resistivity | s-wave | 2024 | T1 | 2406.09607 |
| 1.9 | — | thin_film | resistivity | s-wave | 2024 | T1 | 2406.09607 |
| 0.3 | — | thin_film | resistivity | — | 2011 | T1 | 1105.5150 |
Superconducting parameters
- Pairing symmetry
- s-wave
- λ_eph (e–ph coupling)
- 0.44
Samples & pressure
- Sample form
- thin_film
- Substrate
- sapphire
- Doping type
- electron