Tc max
4.0 K
Tc ambient
3.0 K
arXiv year
1997
Papers
29
Tc exp.
4.0 K
Tc theo.
2.9 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1411.5640, confirmed by 2 papers
Evidence (40 records from 29 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.0 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.174505 |
| 4.0 | — | thin_film | resistivity | — | 2014 | T1 | 1411.5640 |
| 3.5 | — |
Superconducting parameters
- Hc2
- 7.5 T (0.1 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- borosilicate glass or doped Si/SiO
- Pressure type
- none
- Doping type
- none