Tc max
4.0 K
Tc ambient
3.0 K
arXiv year
1997
Papers
27
Tc exp.
4.0 K
Tc theo.
2.9 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1411.5640, confirmed by 2 papers
Evidence (38 records from 27 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 4.0 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.174505 |
| 4.0 | — | thin_film | resistivity | — | 2014 | T1 | 1411.5640 |
| 3.5 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.220508 |
| 3.4 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.220508 |
| 3.2 | — | thin_film | — | — | 2020 | T3 | 2006.00566 |
| 3.2 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.220508 |
| 3.1 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.220508 |
| 3.1 | — | thin_film | resistivity | — | 2014 | T1 | DOI: 10.1103/PhysRevB.89.035149 |
| 3.0 | — | thin_film | resistivity | — | 2025 | T1 | 2512.20130 |
| 3.0 | — | thin_film | resistivity | — | 2022 | T1 | 2207.01669 |
| 3.0 | — | thin_film | resistivity | — | 2014 | T1 | 1411.5640 |
| 3.0 | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevLett.108.177006 |
| 3.0 | — | thin_film | resistivity | — | 2011 | T1 | 1112.0776 |
| 2.9 | — | thin_film | — | — | 2022 | T1 | 2207.01669 |
| 2.8 | — | thin_film | resistivity | — | 2018 | T3 | 1802.10379 |
| 2.8 | — | wire | resistivity | — | 2005 | — | cond-mat/0505577 |
| 2.8 | — | wire | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevLett.95.116805 |
| 2.7 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.220508 |
| 2.7 | — | thin_film | resistivity | — | 2005 | — | cond-mat/0505577 |
| 2.5 | — | thin_film | resistivity, STM | — | 2022 | T1 | DOI: 10.1103/PhysRevB.105.L140505 |
| 2.4 | — | thin_film | — | — | 2022 | T1 | 2207.01669 |
| 2.3 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.220508 |
| 2.0 | — | thin_film | resistivity | — | 1997 | T2 | cond-mat/9709017 |
| 1.5 | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.184515 |
| 1.5 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevLett.92.107005 |
| 1.3 | — | thin_film | resistivity | — | 2004 | T1 | DOI: 10.1103/PhysRevLett.92.107005 |
| 1.2 | — | thin_film | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.91.220508 |
| 0.8 | — | thin_film | resistivity | — | 2025 | T3 | 2510.06894 |
| — | — | thin_film | resistivity, susceptibility | — | 2024 | T3 | 2404.09855 |
| — | — | thin_film | resistivity | — | 2020 | T1 | DOI: 10.1103/PhysRevLett.125.147002 |
| — | — | thin_film | resistivity | — | 2020 | T1 | 2009.14603 |
| — | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.100.184508 |
| — | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.96.104513 |
| — | — | thin_film | resistivity | — | 2012 | T1 | DOI: 10.1103/PhysRevB.85.140507 |
| — | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.84.014529 |
| — | — | thin_film | resistivity | — | 2010 | T1 | 1012.5609 |
| — | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0002065 |
| — | — | thin_film | resistivity | — | 2000 | T1 | cond-mat/0004377 |
Superconducting parameters
- Hc2
- 7.5 T (0.1 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- glass
- Pressure type
- none
- Doping type
- none