Tc max
3.8 K
Tc ambient
2.8 K
arXiv year
1989
Papers
40
Tc exp.
3.8 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, DOI: 10.1103/PhysRevB.44.7555, confirmed by 2 papers
Evidence (65 records from 40 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 3.8 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.4140 |
| 3.8 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.44.7555 |
| 3.6 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.4140 |
| 3.4 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.44.7555 |
| 3.4 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.4140 |
| 3.4 | — | thin_film | resistivity | — | 2004 | T1 | cond-mat/0406227 |
| 3.3 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.44.7555 |
| 3.2 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.144501 |
| 3.1 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.4140 |
| 3.0 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.44.7555 |
| 3.0 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.4140 |
| 2.9 | — | thin_film | resistivity | — | 2004 | T1 | cond-mat/0406227 |
| 2.9 | — | thin_film | resistivity | — | 2024 | T1 | 2405.02276 |
| 2.8 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.144501 |
| 2.8 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevB.99.054515 |
| 2.7 | — | thin_film | STM | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.65.666 |
| 2.7 | — | thin_film | resistivity | — | 2004 | T1 | cond-mat/0406227 |
| 2.6 | — | thin_film | resistivity | — | 2024 | T1 | 2405.02276 |
| 2.6 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.4140 |
| 2.6 | — | thin_film | resistivity | — | 2017 | T1 | 1712.00947 |
| 2.6 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.44.7555 |
| 2.5 | — | thin_film | resistivity | — | 2024 | T1 | 2405.02276 |
| 2.5 | ambient | thin_film | resistivity | — | 2017 | T1 | 1708.01908 |
| 2.4 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.44.7555 |
| 2.4 | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.111.067003 |
| 2.4 | — | thin_film | resistivity | — | 2011 | T1 | DOI: 10.1103/PhysRevB.84.024511 |
| 2.4 | — | thin_film | resistivity | — | 2010 | T1 | 1010.2996 |
| 2.3 | — | thin_film | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.75.184530 |
| 2.3 | — | thin_film | resistivity | — | 2007 | T1 | DOI: 10.1103/PhysRevB.75.094506 |
| 2.3 | — | thin_film | resistivity | — | 2006 | T1 | cond-mat/0612092 |
| 2.2 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.144501 |
| 2.2 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.44.7555 |
| 2.2 | — | thin_film | resistivity | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.4140 |
| 2.0 | — | thin_film | resistivity | — | 2024 | T1 | 2405.02276 |
| 1.9 | — | thin_film | resistivity | — | 2024 | T1 | 2405.02276 |
| 1.6 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.144501 |
| 1.4 | — | thin_film | resistivity | — | 2024 | T1 | 2405.02276 |
| 1.4 | — | thin_film | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevB.109.144501 |
| 1.4 | — | thin_film | resistivity | — | 1991 | T1 | DOI: 10.1103/PhysRevB.44.7555 |
| 1.3 | ambient | thin_film | resistivity | — | 2011 | T3 | 1109.4087 |
| 1.2 | — | thin_film | resistivity | — | 2007 | T1 | 0712.2655 |
| 1.0 | — | thin_film | resistivity | — | 2005 | T1 | DOI: 10.1103/PhysRevLett.94.107008 |
| 0.8 | — | thin_film | resistivity | — | 2001 | T2 | cond-mat/0101447 |
| 0.5 | — | thin_film | resistivity | — | 2017 | T1 | DOI: 10.1103/PhysRevB.96.224511 |
| 0.3 | — | thin_film | resistivity | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.65.927 |
| 0.2 | — | thin_film | resistivity | — | 2001 | T2 | cond-mat/0101447 |
| — | — | — | — | — | 2023 | T1 | 2311.15126 |
| — | — | powder | resistivity | — | 2021 | — | 2110.07251 |
| — | — | thin_film | resistivity | — | 2018 | T1 | DOI: 10.1103/PhysRevLett.121.047003 |
| — | — | thin_film | resistivity | — | 2018 | T1 | 1801.09201 |
| — | — | thin_film | resistivity | — | 2017 | T1 | 1709.04128 |
| — | — | thin_film | resistivity | — | 2016 | T1 | 1504.08115 |
| — | — | thin_film | susceptibility | — | 2014 | T1 | 1402.6295 |
| — | — | thin_film | susceptibility | — | 2013 | T1 | DOI: 10.1103/PhysRevLett.110.037002 |
| — | — | thin_film | resistivity | — | 2013 | T1 | DOI: 10.1103/PhysRevB.88.024509 |
| — | — | thin_film | resistivity | — | 2012 | — | 1209.2965 |
| — | ambient | thin_film | susceptibility, resistivity | — | 2012 | T2 | 1212.1204 |
| — | — | thin_film | resistivity | — | 2012 | T1 | 1212.5177 |
| — | — | thin_film | resistivity | — | 2009 | T1 | 0902.2732 |
| — | — | thin_film | resistivity | — | 2008 | T1 | DOI: 10.1103/PhysRevB.77.212501 |
| — | — | thin_film | susceptibility | — | 2006 | T1 | cond-mat/0604107 |
| — | — | thin_film | resistivity | — | 2004 | T2 | cond-mat/0406232 |
| — | — | — | — | — | 1997 | T2 | cond-mat/9703100 |
| — | — | thin_film | resistivity | — | 1992 | T1 | DOI: 10.1103/PhysRevLett.69.1604 |
| — | — | thin_film | tunneling | — | 1991 | T1 | DOI: 10.1103/PhysRevB.43.3732 |
Structure
- Crystal structure
- amorphous
Superconducting parameters
- Hc2
- 13.0 T (0 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- glass
- Pressure type
- none
- Doping type
- none