InOx

amorphous

ambient SC2D / interfacedisputed

Tc max

3.4 K

Tc ambient

3.4 K

Discovery

1996

Papers

Tc max measured at ambient, amorphous alloy, resistivity, arXiv:cond-mat/9611187, confirmed by 3 papers

Evidence (7 records from 5 papers)

the flat columns above are aggregates — each line here is one paper's claim

Tc (K)	P (GPa)	Sample	Method	Pairing	Year	Paper
3.4	ambient	amorphous alloy	resistivity	—	1996	cond-mat/9611187
3.4	ambient	thin_film	resistivity	—	2004	cond-mat/0406227
2.9	ambient	thin_film	resistivity	—	2004	cond-mat/0406227
2.7	ambient	thin_film	resistivity	—	2004	cond-mat/0406227
1.0	ambient	thin_film	resistivity	—	2004	cond-mat/0406232
—	ambient	thin_film	—	—	1997	cond-mat/9703100
—	ambient	polycrystal	—	—	1997	cond-mat/9706032