Tc max
1.0 K
Tc ambient
1.0 K
arXiv year
1989
Papers
8
Tc exp.
1.0 K
Tc theo.
200.0 K
Evidence
mixed
Tc max measured at ambient, thin_film, resistivity, arXiv:1204.4130
Evidence (8 records from 8 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 200.0 | — | wire | — | — | 1989 | T1 | DOI: 10.1103/PhysRevB.39.4776 |
| 200.0 | — | wire | — | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.10946 |
| 1.0 |
Structure
- Crystal structure
- zincblende
Superconducting parameters
- Hc2
- 0.5 T (stable up to ~0.5 T)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- s-wave superconductor