Tc max
20.0 K
Tc ambient
20.0 K
arXiv year
1991
Papers
39
Tc exp.
22.0 K
Tc theo.
19.0 K
Evidence
experimental
Tc max measured at STM, arXiv:1911.08768, confirmed by 2 papers
Evidence (47 records from 39 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 22.0 | — | thin_film | STM | s-wave | 2020 | T1 | DOI: 10.1103/PhysRevLett.124.187001 |
| 22.0 | — | — | STM | s-wave | 2019 | T1 | 1911.08768 |
| 20.6 |
Structure
- Crystal structure
- face-centered-cubic
- Space group
- Fm3m
- Lattice a (Å)
- 14.208
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- Hc2
- 49.0 T (0 K)
- λ_eph (e–ph coupling)
- 1.20
- ω_log
- 1071 K
Samples & pressure
- Substrate
- silicon nitride
- Doping type
- none